Dr. Kolagani's research program concentrates on developing thin films of various perovskite metal oxides of interest for sensor applications. Metal oxide thin films offer a strong and versatile materials base for the development of novel technologies including nano-scale sensors. Examples include superconducting electronics, microwave communications, ferroelectric memories, infrared detectors, magnetic sensors, strain gauges and gas sensors. The subtle interplay between structure and physical properties makes these materials strong candidates for fundamental materials research. Specifically, current work focuses on the development of uncooled and moderately cooled bolometric infrared detectors based on colossal magnetoresistive (CMR) manganites. Bolometric infrared detectors are of interest for night vision cameras for defense applications as well as for civilian applications such as automobiles, security and surveillance and fire rescue among many others. REU participants will have the opportunity to engage in various aspects of this research which aims at engineering the properties of manganite thin films to achieve state- of-the-art sensor performance. This effort will involve the following tasks at various stages in the course of the project.

Thus, besides being introduced to state-of-the-art IR detector technologies and the fascinating field of the materials physics of perovskite metal oxides, the students will gain hands-on experience in the use above mentioned experimental techniques in materials research.

Another project that will be available for REU participation will be the fabrication of nanostructures in perovskite metal oxide thin films. Fabrication of such nanoscale structures has tremendous implications, given the multifunctional role of perovskite metal oxides in nanoelectronics and nanotechnology. Dr. Kolaganiand Dr. Schaefer have recently started a collaborative effort to realize nanostructures in manganite thin films using scanning probe microscopy. Students working on this project will learn to do AFM lithography, will study the effect of AFM induced material modification on electrical and magneto- transport in thin films and investigate the influence of humidity and the gaseous ambient on the AFM lithography process.

Dr. Kolagani's work involves collaborations with Dr. Smolyaninova in low temperature transport, magnetic and optical measurements, with Dr. Schaefer in the use of atomic force microscopy for surface characterization and nanolithography, with Dr. Lev in the chemical analysis of the films employing Inductively Coupled Plasma Mass Spectrometry and X-Ray fluorescence techniques, and with Dr. Loo and other faculty in the chemistry department for the synthesis of bulk materials and for spectroscopic studies.

Back to main page.